降级(电信)
可靠性工程
可靠性(半导体)
计算机科学
工程类
电信
功率(物理)
物理
量子力学
标识
DOI:10.1109/rams.2000.816300
摘要
The importance of degradation analysis as a method of assessing the reliability of highly reliable components and systems constantly increases due to the continuous efforts of the manufacturers to produce more and more reliable products. The presented methodology is an effective way to estimate the system's reliability by monitoring performance degradation. Its advantage is that the times to failure are not directly observed but the degradation that can be accurately measured. Consequently, the test time can be significantly shorter than if the times to failure are recorded.
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