原子力显微镜
计算机科学
图像质量
纳米技术
质量(理念)
带宽(计算)
加速
超分辨率
图像处理
分辨率(逻辑)
高分辨率
图像(数学)
材料科学
人工智能
物理
遥感
电信
地质学
操作系统
量子力学
出处
期刊:Current Nanoscience
[Bentham Science]
日期:2022-05-01
卷期号:18 (3): 277-290
标识
DOI:10.2174/1573413717666210715110628
摘要
: Atomic force microscope (AFM) has become the main tool for observation and manipulation in nanotechnology research due to its nano-meter high resolution, but the slow imaging speed is one of the important reasons hindering the further development of AFM. This article first introduces the applications of AFM in cell biology in recent years, expresses the importance of rapid imaging in cell biology, and then summarizes the reasons affecting the imaging speed of AFM from three aspects: the limited bandwidth of system mechanical components, obvious inherent characteristics of piezoelectric scanners, and complex image processing algorithms. The improvement and optimization methods of mechanical parts or structure, control algorithm and image processing are reviewed for different influence reasons. Then, the advantages and of different improvement methods, as well as the improved imaging speed and imaging quality improvement effects, are compared. Imaging speed and resolution are both several to dozens of times higher than before, while ensuring image quality and without damaging the samples. The aim of this review is to enable students, the public and even experts of different knowledge backgrounds to learn directly, and select realizable improvement methods according to realistic conditions. Finally, the future development trend and further prospects of high-speed AFM are discussed.
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