Dimensionality Engineering of Organic–Inorganic Halide Perovskites for Next‐Generation X‐Ray Detector

Abstract The next‐generation X‐ray detectors require novel semiconductors with low material/fabrication cost, excellent X‐ray response characteristics, and robust operational stability. The family of organic‐inorganic hybrid perovskites (OIHPs) materials comprises a range of crystal configuration (i.e., films, wafers, and single crystals) with tunable chemical composition, structures, and electronic properties, which can perfectly meet the multiple‐stringent requirements of high‐energy radiation detection, making them emerging as the cutting‐edge candidate for next‐generation X‐ray detectors. From the perspective of molecular dimensionality, the physicochemical and optoelectronic characteristics of OIHPs exhibit dimensionality‐dependent behavior, and thus the structural dimensionality is recognized as the key factor that determines the device performance of OIHPs‐based X‐ray detectors. Nevertheless, the correlation between dimensionality of OIHPs and performance of their X‐ray detectors is still short of theoretical guidance, which become a bottleneck that impedes the development of efficient X‐ray detectors. In the review, the advanced studies on the dimensionality engineering of OIHPs are critically assessed in X‐ray detection application, discussing the current understanding on the “dimensionality‐property” relationship of OIHPs and the state‐of‐the‐art progresses on the dimensionality‐engineered OIHPs‐based X‐ray detector, and highlight the open challenges and future outlook of this field.