光探测
光电探测器
响应度
材料科学
光电子学
半导体
带隙
宽禁带半导体
薄膜
紫外线
制作
纳米结构
暗电流
纳米线
纳米技术
异质结
作者
Liwen Sang,Meiyong Liao,Masatomo Sumiya
出处
期刊:Sensors
[MDPI AG]
日期:2013-08-13
卷期号:13 (8): 10482-10518
被引量:564
摘要
Ultraviolet (UV) photodetectors have drawn extensive attention owing to their applications in industrial, environmental and even biological fields. Compared to UV-enhanced Si photodetectors, a new generation of wide bandgap semiconductors, such as (Al, In) GaN, diamond, and SiC, have the advantages of high responsivity, high thermal stability, robust radiation hardness and high response speed. On the other hand, one-dimensional (1D) nanostructure semiconductors with a wide bandgap, such as β-Ga2O3, GaN, ZnO, or other metal-oxide nanostructures, also show their potential for high-efficiency UV photodetection. In some cases such as flame detection, high-temperature thermally stable detectors with high performance are required. This article provides a comprehensive review on the state-of-the-art research activities in the UV photodetection field, including not only semiconductor thin films, but also 1D nanostructured materials, which are attracting more and more attention in the detection field. A special focus is given on the thermal stability of the developed devices, which is one of the key characteristics for the real applications.
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