原硅酸盐
闪烁
质子
辐照
辐射
核物理学
闪烁计数器
材料科学
物理
辐射损伤
放射化学
伽马射线
荧光粉
光学
化学
正硅酸乙酯
纳米技术
探测器
作者
E. Auffray,A. Fedorov,M. Korjik,M. T. Lucchini,V. Mechinski,N. N. Naumenko,А. П. Войтович
出处
期刊:IEEE Transactions on Nuclear Science
[Institute of Electrical and Electronics Engineers]
日期:2014-01-31
卷期号:61 (1): 495-500
被引量:14
标识
DOI:10.1109/tns.2013.2285249
摘要
Radiation damage effects in lutetium, yttrium and gadolinium oxy-orthosilicates, Lu 2 SiO 5 :Ce, Y 2 SiO 5 :Ce, Gd 2 SiO 5 :Ce under γ- and protons irradiation have been investigated. Crystals were irradiated with a 60 Co gamma source to a total dose of 2000 Gy and a high-rate 24-GeV proton beam at CERN PS, to a fluence of ~3.6 ×10 13 p/cm 2 . Color centers created under irradiation, phosphorescence and its mechanism in the crystals are discussed.
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