电阻随机存取存储器
香料
支柱
计算机科学
点(几何)
缩放比例
三维集成电路
能量(信号处理)
电极
电阻式触摸屏
电子工程
能源消耗
材料科学
光电子学
电气工程
集成电路
工程类
机械工程
电压
物理
几何学
数学
量子力学
计算机视觉
作者
Yexin Deng,Hongyu Chen,Bin Gao,Shimeng Yu,Shih-Chieh Wu,Liang Zhao,Bing Chen,Zizhen Jiang,Xiaoyan Liu,Tuo‐Hung Hou,Yoshio Nishi,Jinfeng Kang,H.‐S. Philip Wong
标识
DOI:10.1109/iedm.2013.6724693
摘要
3D RRAM arrays are studied at the device- and architecture-levels. The memory cell performance for a horizontal cross-point is shown experimentally to be essentially comparable to vertical pillar-around geometry. Array performances (read/write, energy, and speed) of different 3D architectures are investigated by SPICE simulation, showing horizontal stacked RRAM is superior but suffers from higher bit cost. Adopting a bi-layer pillar electrode structure is demonstrated to enlarge the array size in 3D vertical RRAM. Design guidelines are proposed for the 3D VRRAM: it shows that increasing the number of stacks of VRRAM while keeping the total bits the same, as well as scaling of feature size (F), are critical for reducing RC delay and energy consumption.
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