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Effect of Defects on Optical, Electronic, and Interface Properties of NiO/SnO2 Heterostructures: Dual-Functional Solar Photocatalytic H2 Production and RhB Degradation

光催化 材料科学 异质结 非阻塞I/O 光电流 X射线光电子能谱 分解水 带隙 载流子 化学工程 光化学 纳米技术 催化作用 光电子学 化学 生物化学 工程类
作者
Dileep Maarisetty,Saroj Sundar Baral
出处
期刊:ACS Applied Materials & Interfaces [American Chemical Society]
卷期号:13 (50): 60002-60017 被引量:18
标识
DOI:10.1021/acsami.1c19544
摘要

Photocatalytic H2 evolution and organic pollutant oxidation have witnessed a radical surge in recent times. However, this integration demands spatial charge separation and unique interface properties for a trade-off between oxidation and reduction reactions. In the current work, defect engineering of NiO/SnO2 nanoparticles aided in altering the optoelectronics and interface properties and enhanced photocatalytic activity. After annealing the catalysts in a N2 atmosphere, the hydroxyl groups were replaced by water molecules through surface modification. The photoexcited holes accumulated on SnO2 break the water molecules and facilitate the reduction of protons on NiO; this is known as spatial separation. Meanwhile, direct hole oxidation, an oxygen reduction reaction, ensures the degradation activity in this 2-fold system. By defect engineering, the limitations of SnO2 such as higher H2O adsorption, wide bandgap (reduced from 3.02 to 1.88 eV), and electronic properties were addressed. The H2 production in the current work has attained a value of 3732 μmol/(g h), which is 2.9 times that of the previous best reported under sunlight. Recyclability tests confirmed the stability of vacancies by promoting the reoxidation of defect states during photocatalytic activity. Additionally, efforts were made to study the effect of defect density on the photocurrent, the electrical resistance, and the mechanism of photocatalytic reactions. Electrochemical characterizations, UPS, XPS, UV-DRS, and PL were employed to understand the influence of defects on the bandgap, charge recombination, charge transport, charge carrier lifetime, and the interface properties that are responsible for photocatalytic activity. In this regard, it was understood that maintaining the optimal defect concentration is important for higher photocatalytic efficiencies, as the defect optimality preserves key photocatalytic properties. Apart from characterizations, the photocatalytic results suggest that excess defect density triggers the undesired thermodynamically favored back reactions, which greatly hampered the H2 yield of the process.

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