Direct and Label‐Free Detection of Solid‐Phase‐Bound Compounds by Using Surface‐Enhanced Raman Scattering Microspectroscopy

Angewandte Chemie International EditionVolume 46, Issue 25 p. 4786-4789 Communication Direct and Label-Free Detection of Solid-Phase-Bound Compounds by Using Surface-Enhanced Raman Scattering Microspectroscopy† Carsten Schmuck Prof. Dr., Carsten Schmuck Prof. Dr. schmuck@chemie.uni-wuerzburg.de Institut für Organische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-4625Search for more papers by this authorPeter Wich Dipl.-Chem., Peter Wich Dipl.-Chem. Institut für Organische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-4625Search for more papers by this authorBernd Küstner Dipl.-Chem., Bernd Küstner Dipl.-Chem. Institut für Physikalische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-6332Search for more papers by this authorWolfgang Kiefer Prof. Dr., Wolfgang Kiefer Prof. Dr. Institut für Physikalische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-6332Search for more papers by this authorSebastian Schlücker Priv.-Doz. Dr., Sebastian Schlücker Priv.-Doz. Dr. sebastian.schluecker@uni-wuerzburg.de Institut für Physikalische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-6332Search for more papers by this author Carsten Schmuck Prof. Dr., Carsten Schmuck Prof. Dr. schmuck@chemie.uni-wuerzburg.de Institut für Organische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-4625Search for more papers by this authorPeter Wich Dipl.-Chem., Peter Wich Dipl.-Chem. Institut für Organische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-4625Search for more papers by this authorBernd Küstner Dipl.-Chem., Bernd Küstner Dipl.-Chem. Institut für Physikalische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-6332Search for more papers by this authorWolfgang Kiefer Prof. Dr., Wolfgang Kiefer Prof. Dr. Institut für Physikalische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-6332Search for more papers by this authorSebastian Schlücker Priv.-Doz. Dr., Sebastian Schlücker Priv.-Doz. Dr. sebastian.schluecker@uni-wuerzburg.de Institut für Physikalische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany, Fax: (+49) 931-888-6332Search for more papers by this author First published: 11 June 2007 https://doi.org/10.1002/anie.200605190Citations: 39 † We thank the DFG (SFB 630, TP A3 and C1) and the Fonds der Chemischen Industrie for ongoing financial support of our work. Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Graphical Abstract Sensitive and specific: By using surface-enhanced Raman scattering (SERS) microspectroscopy, solid-phase-bound compounds can be detected directly and marker-free in a few seconds on a single polystyrene bead. No significant contributions of the matrix are observed, as demonstrated by reference Raman spectra. Citing Literature Supporting Information Supporting information for this article is available on the WWW under http://www.wiley-vch.de/contents/jc_2002/2007/z605190_s.pdf or from the author. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article. Volume46, Issue25June 18, 2007Pages 4786-4789 RelatedInformation