晶体管
材料科学
光电子学
纳米
量子隧道
泄漏(经济)
硅
碳纳米管场效应晶体管
电极
纳米技术
栅氧化层
电气工程
场效应晶体管
电压
化学
工程类
物理化学
复合材料
经济
宏观经济学
作者
Sujay B. Desai,Surabhi R. Madhvapathy,Angada B. Sachid,Juan Pablo Llinas,Qingxiao Wang,Geun Ho Ahn,Gregory Pitner,Moon J. Kim,J. Bokor,Chenming Hu,H.‐S. Philip Wong,Ali Javey
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:2016-10-06
卷期号:354 (6308): 99-102
被引量:1237
标识
DOI:10.1126/science.aah4698
摘要
A flatter route to shorter channels High-performance silicon transistors can have gate lengths as short as 5 nm before source-drain tunneling and loss of electrostatic control lead to unacceptable leakage current when the device is off. Desai et al. explored the use of MoS 2 as a channel material, given that its electronic properties as thin layers should limit such leakage. A transistor with a 1-nm physical gate was constructed with a MoS 2 bilayer channel and a single-walled carbon nanotube gate electrode. Excellent switching characteristics and an on-off state current ratio of ∼10 6 were observed. Science , this issue p. 99
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