蓝宝石
原始数据
质量(理念)
计算机科学
控制(管理)
钥匙(锁)
蓝宝石上的硅
数据挖掘
人工智能
光学
计算机安全
物理
激光器
量子力学
程序设计语言
作者
I. T. Orlov,Frederic Falise
标识
DOI:10.1109/cstic49141.2020.9282471
摘要
We illustrate how automated scanners visualise internal defects in raw sapphire prior to its processing, and present some defect statistics that Scientific Visual has collected over five years of serving key sapphire suppliers in Europe and Asia. The article illustrates use of defect location and morphology data to reveal trends in sapphire quality, compare production modes, and to find out the optimal parameters for sapphire growth.
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