材料科学
兴奋剂
电场
掺杂剂
薄膜
铁电性
折射率
脉冲激光沉积
分析化学(期刊)
光电子学
光学
纳米技术
电介质
化学
量子力学
色谱法
物理
作者
Xueyou Yuan,Yuji Sakurai,Shinya Kondo,Masahito Yoshino,Takanori Nagasaki,Tomoaki Yamada
标识
DOI:10.35848/1347-4065/ac7ea9
摘要
Abstract The rising of thin-film-based plasmonic electro-optic (EO) devices triggers considerable exploitation of ferroelectric oxide thin films with large EO response. In this study, epitaxial (001)-orientated Ni-doped K(Ta 0.6 Nb 0.4 )O 3 (KTN) films were fabricated on SrRuO 3 /SrTiO 3 substrates via pulsed laser deposition. In comparison with a pure KTN film, a larger withstand electric field was achieved by Ni doping. The EO measurements revealed that the doping of Ni ions induced a decrease in the effective EO coefficient. Instead, the variation of refractive index by the applicable maximum electric field was increased due to the increment of withstand electric field, particularly for the case of 2% Ni dopant.
科研通智能强力驱动
Strongly Powered by AbleSci AI