纳米压痕
材料科学
氧化铟锡
复合材料
锡
氧化物
薄膜
铟
纳米技术
冶金
作者
Evghenii Harea,Katerina E. Aifantis,K. M. Pyrtsac,Lidia Ghimpu
出处
期刊:NATO science for peace and security series
日期:2014-12-16
卷期号:: 53-59
标识
DOI:10.1007/978-94-017-9697-2_5
摘要
The piezoresistivity of indium-tin-oxide (ITO) thin films was investigated using the three point bending method combined with cyclic indentation. The 500 nm thick ITO films were deposited on glass slides using magnetron sputtering. The resistance variation of the resulting ITO/glass based sensors during cyclic indentation showed a good sensitivity and fast response to mechanical strain, with the gauge factor ranging from −1.4 to −3.7.
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