随机数生成
NIST公司
随机性试验
密码学
计算机科学
铁电性
材料科学
随机性
光电子学
数学
算法
统计
电介质
自然语言处理
作者
Seongkweon Kang,Doojin Hong,Biswajit Das,Sang‐Min Lee,Ji‐Sang Park,Yoonmyung Lee,Sungjoo Lee
标识
DOI:10.1002/adma.202406850
摘要
Abstract True random number generators (TRNGs), which create cryptographically secure random bitstreams, hold great promise in addressing security concerns regarding hardware, communication, and authentication in the Internet of Things (IoT) realm. Recently, TRNGs based on nanoscale materials have gained considerable attention for avoiding conventional and predictable hardware circuitry designs that can be vulnerable to machine learning (ML) attacks. In this article, a low‐power and low‐cost TRNG developed by exploiting stochastic ferroelectric polarization switching in 2D ferroelectric CuInP 2 S 6 (CIPS)‐based capacitive structures, is reported. The stochasticity arises from the probabilistic switching of independent electrical dipoles. The TRNG exhibits enhanced stochastic variability with near‐ideal entropy, uniformity, uniqueness, Hamming distance, and independence from autocorrelation variations. Its unclonability is systematically examined using device‐to‐device variations. The generated cryptographic bitstreams pass the National Institute of Standards and Technology (NIST) randomness tests. This nanoscale CIPS‐based TRNG is circuit‐integrable and exhibits potential for hardware security in edge devices with advanced data encryption.
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