绝缘体(电)
MOSFET
兴奋剂
功率MOSFET
绝缘体上的硅
材料科学
计算物理学
光电子学
航程(航空)
电子工程
电气工程
物理
计算机科学
工程类
硅
复合材料
电压
晶体管
作者
Mingmin Huang,Chen Xingbi
出处
期刊:Journal of Semiconductors
[IOP Publishing]
日期:2016-06-01
卷期号:37 (6): 064014-064014
被引量:2
标识
DOI:10.1088/1674-4926/37/6/064014
摘要
A superjunction (SJ) structure using a high-k (Hk) insulator is studied and optimized by using an analytic model. Results by using the proposed model match well with that of numerical calculations. Numerical calculation results show that, only needing an Hk insulator with a permittivity of I = 5S, the optimum specific on-resistance of the MOSFET applying the proposed structure is about 8%–20% lower than that of the conventional SJ-MOSFET with VB = 200–1000 V. An example with VB = 400 V shows that, the permissible error range of doping concentration of the p-region to maintain above 80% of VB is from −37% to +32% for the former and is only from −13% to +13% for the latter.
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