记忆电阻器
材料科学
重置(财务)
热传导
电阻率和电导率
化学物理
复合材料
化学
电子工程
电气工程
金融经济学
工程类
经济
作者
Zhensen Tang,Liang Fang,Nuo Xu,Rulin Liu
摘要
The effects of the forming compliance current (CC) on bipolar resistive switching (BRS) characteristics in Au/Ti/TiO2/Au memristive switches were investigated. After forming with a low CC, a typical BRS with an abrupt SET and negative differential resistance RESET behaviors were observed. In comparison, the sample formed with a high CC exhibited an abnormal BRS with stepwise SET and abrupt RESET transitions. The conduction mechanisms at a high resistance state and a low resistance state were analyzed, respectively. The impact of the forming compliance on the interfacial reaction between Ti and TiO2 was discussed. The Ti-induced interfacial layer played an important role of manipulating the oxygen vacancies, thus providing the possibility of affecting the switching behavior. A physical model based on a combination of the bulk and interfacial effects was proposed to explain our observations.
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