Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

Journal Article Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling Get access Hirokazu Sasaki, Hirokazu Sasaki *To whom correspondence should be addressed. E-mail: hisasaki@jfcc.or.jp Search for other works by this author on: Oxford Academic PubMed Google Scholar Takeyoshi Matsuda, Takeyoshi Matsuda Search for other works by this author on: Oxford Academic PubMed Google Scholar Takeharu Kato, Takeharu Kato Search for other works by this author on: Oxford Academic PubMed Google Scholar Takemi Muroga, Takemi Muroga Search for other works by this author on: Oxford Academic PubMed Google Scholar Yasuhiro Iijima, Yasuhiro Iijima Search for other works by this author on: Oxford Academic PubMed Google Scholar Takashi Saitoh, Takashi Saitoh Search for other works by this author on: Oxford Academic PubMed Google Scholar Fusako Iwase, Fusako Iwase Search for other works by this author on: Oxford Academic PubMed Google Scholar Yutaka Yamada, Yutaka Yamada Search for other works by this author on: Oxford Academic PubMed Google Scholar Teruo Izumi, Teruo Izumi Search for other works by this author on: Oxford Academic PubMed Google Scholar Yuh Shiohara, Yuh Shiohara Search for other works by this author on: Oxford Academic PubMed Google Scholar ... Show more Tsukasa Hirayama Tsukasa Hirayama Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 53, Issue 5, October 2004, Pages 497–500, https://doi.org/10.1093/jmicro/dfh067 Published: 01 October 2004 Article history Received: 19 February 2004 Accepted: 14 June 2004 Published: 01 October 2004