符号
休克(循环)
可靠性(半导体)
计算机科学
算法
数学
离散数学
算术
物理
量子力学
医学
内科学
功率(物理)
作者
Xinqian Huang,Liang Xu,Ying Huang,Yisong Fang
出处
期刊:IEEE Access
[Institute of Electrical and Electronics Engineers]
日期:2023-01-01
卷期号:11: 18227-18233
被引量:6
标识
DOI:10.1109/access.2023.3247449
摘要
This paper studies a reliability modeling for a $k$ -out-of- $n$ : $F$ load sharing system that operates in a shock environment. Such a system consists of a protective device and $n$ components with load sharing. The base hazard rate of the loading sharing system is affected by random shocks and the protective device. Random shocks can be classified into two types: invalid shock and valid shock. An invalid shock has no influence on the system whereas a valid shock makes the base hazard rate larger. The system fails, if the number of failed components is at least $k$ , the system suffers at least $M$ random shocks or the protective device fails, whichever occurs first. A Markov process is used to evaluate system reliability in this paper. A distributed computer system is given to show application of the proposed model.
科研通智能强力驱动
Strongly Powered by AbleSci AI