Lv11
10 积分 2024-12-16 加入
On the Control of the Fixed Charge Densities in Al2O3-Based Silicon Surface Passivation Schemes
52分钟前
已完结
Experimental evidence for the flatband voltage shift of high-k metal-oxide-semiconductor devices due to the dipole formation at the high-k∕SiO2 interface
54分钟前
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Analysis of structural effect on mechanical stress at backside deep trench isolation using finite element method
1小时前
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An Investigation of Field-Effect Passivation Layer Characteristics Using Second Harmonic Generation Measurement
2小时前
已完结
The Influence of the Film Adjustment for Deep Trench Isolation (DTI) Filling on the Thermal Quality in CMOS Image Sensor
2小时前
已完结
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