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20 积分 2025-02-20 加入
Analysis of the Role of Interfacial Layer in Ferroelectric FET Failure as a Memory Cell
1天前
待确认
Silicon doped hafnium oxide (HSO) and hafnium zirconium oxide (HZO) based FeFET: A material relation to device physics
1天前
待确认
Perspective Roadmap of Advanced HfO2-based Ferroelectric Field Effect Transistors
1天前
待确认
Integration of Hafnium Oxide on Epitaxial SiGe for p-type Ferroelectric FET Application
1天前
待确认
Ferroelectric field-effect transistors based on HfO2: a review
1天前
已完结
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