Research on Reliability Accelerated Growth Test and Evaluation Method of Electronic Product

Reliability growth test under normal stress (simulating the stress of a product under actual use conditions) requires a long test cycle, also consumes many human and material resources, and its application in engineering is limited. In order to realize the rapid growth of electronic product reliability, the accelerated reliability growth test is proposed to correct the failure in the test in time, and make the product reliability level improve continuously by test-improvement-test again-improvement again. In this paper, the quantitative evaluation of reliability accelerated growth test is realized by the correlation extrapolation of the multi-stress integrated acceleration factor and reliability growth model under normal stress, and it is applied in the engineering development of electronic products.