材料科学
金属
数码产品
氧化物
纳米技术
电介质
高-κ电介质
光电子学
电气工程
冶金
工程类
作者
Dasari Venkatakrishnarao,Abhishek Mishra,Yaoju Tarn,Michel Bosman,Rainer Lee,Sarthak Das,Subhrajit Mukherjee,Teymour Talha-Dean,Yiyu Zhang,Siew Lang Teo,Jianwei Chai,Fabio Bussolotti,Kuan Eng Johnson Goh,Chit Siong Lau
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-09-18
标识
DOI:10.1021/acsnano.4c08554
摘要
Two-dimensional van der Waals semiconductors are promising for future nanoelectronics. However, integrating high-k gate dielectrics for device applications is challenging as the inert van der Waals material surfaces hinder uniform dielectric growth. Here, we report a liquid metal oxide-assisted approach to integrate ultrathin, high-k HfO
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