电容感应
分流(医疗)
宽带
高电子迁移率晶体管
电气工程
拓扑(电路)
插入损耗
材料科学
计算机科学
光电子学
晶体管
电子工程
工程类
电压
医学
外科
作者
Chien‐Ming Tsao,Heng‐Tung Hsu
出处
期刊:IEEE Transactions on Circuits and Systems Ii-express Briefs
[Institute of Electrical and Electronics Engineers]
日期:2023-06-16
卷期号:70 (11): 4013-4017
标识
DOI:10.1109/tcsii.2023.3286884
摘要
This brief presents an ultra-wideband, series-shunt type single-pole-double-throw (SPDT) switch with high isolation and good power handling capability from DC to 40 GHz. A new topology using capacitive loading on the shunt arms was proposed to improve the isolation across the entire band. The effect of the capacitive loading has been theoretically analyzed. Using the simple SPDT topology with one shunt arm as comparison, the capacitive loading approach exhibited an improvement of 5.9 dB in isolation at 40 GHz. To enhance the power handling capability, the stacked-FET configuration was adopted at the shunt arms. The optimum design has been implemented in the commercially available 0.15- $\mu \text{m}$ GaAs pseudomorphic high-electron-mobility transistor (pHEMT) process and demonstrated an insertion loss of less than 3 dB, an isolation of greater than 39 dB, and an input 1-dB compression point (P textsubscript 1dB) of better than 32 dBm from DC to 40 GHz. To our knowledge, the proposed SPDT switch demonstrates the highest isolation over the widest bandwidth among other reported works to date.
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