纳米材料
光谱学
材料科学
吸收(声学)
X射线吸收精细结构
纳米技术
物理
复合材料
量子力学
作者
Chenyu Zhou,Mingzhao Liu
出处
期刊:Elsevier eBooks
[Elsevier]
日期:2023-01-01
卷期号:: 50-64
标识
DOI:10.1016/b978-0-12-822425-0.00039-7
摘要
X-ray absorption fine structure (XAFS) is a powerful X-ray spectroscopy technique developed to interrogate materials for their structural and chemical properties, and is widely employed in nanomaterials research. This article features an overview on the basic principles and experimental techniques of XAFS, followed by a number of examples in which XAFS help solve problems that are unique to nanoscience and nanotechnology. The example gives a broad coverage on how XAFS infers morphology and atomic motifs of nanomaterials in steady states, using ex situ spectral techniques, as well as how XAFS tracks the structural evolution of nanomaterials during active processes, such as catalysis and nanomaterials growth, using in situ and in operando techniques.
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