光电探测器
光电子学
响应度
光探测
异质结
材料科学
各向异性
极化(电化学)
范德瓦尔斯力
比探测率
宽带
拉曼光谱
光学
物理
化学
物理化学
量子力学
分子
作者
Pu Wang,Zhao Li,Xue Xia,Jingni Zhang,Yingying Lan,Hugh Zhu,Qingqing Ke,Haoran Mu,Shenghuang Lin
出处
期刊:Small
[Wiley]
日期:2024-04-09
被引量:7
标识
DOI:10.1002/smll.202401216
摘要
Abstract Polarization‐sensitive broadband optoelectronic detection is crucial for future sensing, imaging, and communication technologies. Narrow bandgap 2D materials, such as Te and PdSe 2 , show promise for these applications, yet their polarization performance is limited by inherent structural anisotropies. In this work, a self‐powered, broadband photodetector utilizing a Te/PdSe 2 van der Waals (vdWs) heterojunction, with orientations meticulously tailored is introduced through polarized Raman optical spectra and tensor calculations to enhance linear polarization sensitivity. The device exhibits anisotropy ratios of 1.48 at 405 nm, 3.56 at 1550 nm, and 1.62 at 4 µm, surpassing previously‐reported photodetectors based on pristine Te and PdSe 2 . Additionally, it exhibits high responsivity (617 mA W −1 at 1550 nm), specific detectivity (5.27 × 10 10 Jones), fast response (≈4.5 µs), and an extended spectral range beyond 4 µm. The findings highlight the significance of orientation‐engineered heterostructures in enhancing polarization‐sensitive photodetectors and advancing optoelectronic technology.
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