X射线光电子能谱
俄歇电子能谱
分子束外延
基质(水族馆)
材料科学
外延
图层(电子)
氧化物
分析化学(期刊)
光电子学
化学
化学工程
纳米技术
冶金
有机化学
地质学
工程类
物理
核物理学
海洋学
作者
W. K. Liu,Peter Yuen,R. A. Stradling
出处
期刊:Journal of vacuum science & technology
[American Vacuum Society]
日期:1995-07-01
卷期号:13 (4): 1539-1545
被引量:65
摘要
Several chemical cleaning procedures for InSb(100) substrates were studied. Nomarski microscopy, x-ray photoelectron spectroscopy, and Auger electron spectroscopy were used to assess their credibility for use in molecular beam epitaxial growth of high quality films. The most satisfactory substrate surface was prepared using a modified CP4A etchant (HNO3:CH3COOH:HF:DI H2O at 2:1:1:10). This etchant was found to produce a flat surface with low defect density and a passivating layer consisting mainly of easily removable Sb oxide.
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