欧姆接触
肖特基势垒
异质结
半导体
范德瓦尔斯力
杰纳斯
材料科学
肖特基二极管
光电子学
凝聚态物理
纳米技术
图层(电子)
化学
二极管
物理
分子
有机化学
作者
Chương V. Nguyen,Cuong Q. Nguyen,Son‐Tung Nguyen,Yee Sin Ang,Nguyen Van Hieu
标识
DOI:10.1021/acs.jpclett.2c00245
摘要
Following the successful synthesis of single-layer metallic Janus MoSH and semiconducting MoSi2N4, we investigate the electronic and interfacial features of metal/semiconductor MoSH/MoSi2N4 van der Waals (vdW) contact. We find that the metal/semiconductor MoSH/MoSi2N4 contact forms p-type Schottky contact (p-ShC type) with small Schottky barrier (SB), suggesting that Janus MoSH can be considered as an efficient metallic contact to MoSi2N4 semiconductor with high charge injection efficiency. The electronic structure and interfacial features of the MoSH/MoSi2N4 vdW heterostructure are tunable under strain and electric fields, which give rise to the SB change and the conversion from p-ShC to n-ShC type and from ShC to Ohmic contact. These findings could provide a new pathway for the design of optoelectronic applications based on metal/semiconductor MoSH/MoSi2N4 vdW heterostructures.
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