焊接
可靠性(半导体)
接头(建筑物)
铅(地质)
材料科学
过程(计算)
电子包装
可靠性工程
压力(语言学)
机械工程
结构工程
工程类
计算机科学
复合材料
功率(物理)
语言学
物理
地质学
操作系统
哲学
量子力学
地貌学
作者
Michal Nicák,Olga Švecová,Jiří Pulec,Josef Šandera,Ivan Szendiuch
出处
期刊:Key Engineering Materials
日期:2011-01-01
卷期号:465: 491-494
被引量:3
标识
DOI:10.4028/www.scientific.net/kem.465.491
摘要
This paper deals with behavior of lead-free solder joint applied in 3D electronic packaging structure. There are plenty of factors which influences reliability and life-time of solder compound connection. Type of substrates, selection of materials and process arrangement are the main areas to investigate. The content consists from three main parts. The first deals with introduction of designed test pattern, material, and process arrangement and applied testing methods. Second part continues with ANSYS software simulation of solder interconnections during thermo-mechanical stress tests and third part is aimed to experimental evaluation of results in the comparison to simulated results.
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