纳米光刻
平版印刷术
复制(统计)
材料科学
干法蚀刻
相容性(地球化学)
纳米技术
过程(计算)
模具
计算机科学
光电子学
图层(电子)
蚀刻(微加工)
制作
复合材料
操作系统
病理
统计
医学
替代医学
数学
作者
J. Haisma,Martin J. Verheijen,Kees van den Heuvel,Jan van den Berg
出处
期刊:Journal of vacuum science & technology
[American Vacuum Society]
日期:1996-11-01
卷期号:14 (6): 4124-4128
被引量:611
摘要
A process for reproducibly and reliably realizing thin-layer patterning having details with dimensions of 100 nm or even less is described. This process has been called mold lithography. It is a two-step process: First, a photopolymerization-replication step is carried out, after which pattern transfer is realized through, e.g., wet or dry etching into the substrate material. We performed a number of elementary experiments to evaluate this process. Processing conditions are given and the obtained results are discussed. The strengths of this process are its simplicity and low cost while maintaining compatibility with (standard) semiconductor-technology processing.
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