氧化物
合金
椭圆偏振法
材料科学
图层(电子)
腐蚀
氧化铁
冶金
化学工程
薄膜
复合材料
纳米技术
工程类
作者
K.‐J. Eichhorn,W. Forker
标识
DOI:10.1016/0010-938x(88)90114-x
摘要
The primary oxide and water films on iron and low alloy steels have been characterized using ellipsometry. Ellipsometry data obtained during stepwise water film formation are consistent with a model of two layers on iron where the water layer grows and the primary oxide layer remains unchanged in thickness. The thickness of water films on primary oxide layers falls within 0–4 nm and depends significantly on atmospheric conditions. The growth properties of water films are influenced by SO2. Stepwise drying studies give results which indicate modification of the primary oxide-water film interfaces.
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