材料科学
电压
光电子学
电气工程
频道(广播)
低压
作者
Atsushi Ohoka,Masao Uchida,Tsutomu Kiyosawa,Nobuyuki Horikawa,Kouichi Saitou,Yoshihiko Kanzawa,Haruyuki Sorada,Kazuyuki Sawada,Tetsuzo Ueda
出处
期刊:International Symposium on Power Semiconductor Devices and IC's
日期:2018-05-13
卷期号:: 52-55
被引量:1
标识
DOI:10.1109/ispsd.2018.8393600
摘要
Trade-off between threshold voltage and specific on-resistance is successfully overcome in a diode-integrated SiC MOSFET by improving the design of n-type epitaxial channel layer and p-type body region. This new design features enhanced transconductance, hence low on-state resistance, while retaining high threshold voltage. Obtained specific on-resistance of the fabricated 1200V SiC DioMOS is among the lowest achieved for SiC MOSFETs including trench devices. The transconductance enhancement is also demonstrated to be effective in increasing the turn-on switching speed, thus contributing to higher efficiency in power switching systems with reduced conduction and switching losses.
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