抵抗
聚合物
共聚物
材料科学
平版印刷术
催化作用
聚合
高分子化学
金属
溶解
光刻胶
化学工程
化学
纳米技术
有机化学
复合材料
冶金
工程类
光电子学
图层(电子)
作者
Hoang V. Tran,Raymond Hung,Takashi Chiba,Shintaro Yamada,Thomas Mrozek,Yu‐Tsai Hsieh,Charles R. Chambers,Brian Osborn,Brian C. Trinque,M.J. Pinnow,Scott Macdonald,C. Grant Willson,Daniel P. Sanders,Eric F. Connor,Robert H. Grubbs,Will Conley
出处
期刊:Macromolecules
[American Chemical Society]
日期:2002-07-11
卷期号:35 (17): 6539-6549
被引量:52
摘要
Three metal-catalyzed vinyl addition copolymers derived from partially fluorinated norbornenes and tricyclononenes have been synthesized and evaluated for use in formulating photoresists for 157 nm lithography imaging. The transparency of these polymers at 157 nm, as measured by variable angle spectroscopic ellipsometry (VASE), is greatly improved over their nonfluorinated counterparts. The results of preliminary lithographic evaluations of resists formulated from these polymers alone and with the addition of several new fluorinated dissolution inhibitors are presented. Images as small as 70 nm have been printed in some formulations.
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