卤化物
显微镜
材料科学
化学
结晶学
纳米技术
无机化学
光学
物理
作者
Shresth Gupta,Sayan Bhattacharyya
摘要
Scanning probe microscopy (SPM) with advanced atomic force microscopy (AFM++) have become pivotal for nanoscale elucidation of the structure, optoelectronic and photovoltaic properties of halide perovskite single crystals and polycrystalline...
科研通智能强力驱动
Strongly Powered by AbleSci AI