快离子导体
硅酸盐
离子电导率
电导率
薄膜
材料科学
电化学
分析化学(期刊)
矿物学
化学工程
无机化学
化学
电极
纳米技术
电解质
物理化学
色谱法
工程类
作者
Д. В. Иванов,J. F. Currie,Hervé Bouchard,A. Lecours,J ANDRIAN,A. Yelon,S. Poulin
标识
DOI:10.1016/0167-2738(94)90020-5
摘要
We have demonstrated for the first time the production of silicate-limit NASICON [Na4Zr2(SiO4)3] in the form of thin films. The ionic conductivity was investigated as a function of the temperature. The best measured conductivity at 300°C is 0.5×10-4 (S/cm)-1. We report here on the evaluation of the mechanical properties sputtered NASICON thin films
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