MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE

扫描透射电子显微镜 表征(材料科学) 电子能量损失谱 材料科学 电子断层摄影术 高分辨率透射电子显微镜 光谱学 原子单位 电子 光学 对比度传递函数 纳米技术 透射电子显微镜 球差 物理 镜头(地质) 量子力学
作者
M. Varela,Andrew R. Lupini,Klaus van Benthem,Albina Y. Borisevich,Matthew F. Chisholm,Naoya Shibata,Eiji Abe,Stephen J. Pennycook
出处
期刊:Annual Review of Materials Research [Annual Reviews]
卷期号:35 (1): 539-569 被引量:183
标识
DOI:10.1146/annurev.matsci.35.102103.090513
摘要

▪ Abstract In the nanoscience era, the properties of many exciting new materials and devices will depend on the details of their composition down to the level of single atoms. Thus the characterization of the structure and electronic properties of matter at the atomic scale is becoming ever more vital for economic and technological as well as for scientific reasons. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) represents a powerful method to link the atomic and electronic structure to macroscopic properties, allowing materials, nanoscale systems, and interfaces to be probed in unprecedented detail. Z-contrast STEM uses electrons that have been scattered to large angles for imaging. The relative intensity of each atomic column is roughly proportional to Z 2 , where Z is the atomic number. Recent developments in correcting the aberrations of the lenses in the electron microscope have pushed the achievable spatial resolution and the sensitivity for imaging and spectroscopy in the STEM into the sub-Ångstrom (sub-Å) regime, providing a new level of insight into the structure/property relations of complex materials. Images acquired with an aberration-corrected instrument show greatly improved contrast. The signal-to-noise ratio is sufficiently high to allow sensitivity even to single atoms in both imaging and spectroscopy. This is a key achievement because the detection and measurement of the response of individual atoms has become a challenging issue to provide new insight into many fields, such as catalysis, ceramic materials, complex oxide interfaces, or grain boundaries. In this article, the state-of-the-art for the characterization of all of these different types of materials by means of aberration-corrected STEM and EELS are reviewed.
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