钝化
钙钛矿(结构)
材料科学
吸附
光伏
单层
光致发光
氧化物
分子
化学物理
化学工程
纳米技术
光伏系统
化学
物理化学
光电子学
图层(电子)
冶金
有机化学
生物
工程类
生态学
作者
Peng Zeng,Qinghong Zhang,Yifeng Zhang,Bing Cai,Guanqun Feng,Yixiao Wang,Chengsong Zeng,Wen‐Hua Zhang,Mingzhen Liu
摘要
Surface defect passivation through additional molecular bonding plays a crucial role in optimization of perovskite-based photovoltaic devices. So far, quantization of the defect site coverage by molecular passivation remains unclear from a macroscopic view. We herein unravel the coverage possibility of the surface defect sites of perovskite films by the added molecule passivators upon an MAPbI3 perovskite system. Concerns of inconsistent time-resolved photoluminescence (TRPL) spectroscopic measurements are dispelled by vapor-deposition fabrications of highly uniform perovskite films. The surface defect densities of perovskite films are derived from global fittings of the charge carrier dynamics to the measured TRPL decays. It is revealed the Langmuir adsorption relationship of the defect site coverage with respect to the added amount of tri-n-octylphosphine oxide passivation molecules. Our work supplements the dynamical bonding model of the molecular passivation process and provides reliable knowledge upon the bonding process between molecules and defects, which leads to rationalized surface passivation methodologies in perovskite photovoltaics communities.
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