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90 积分 2021-06-09 加入
An analysis of the power transistors of electric vehicle inverters: present and the future trends
1天前
待确认
In-Circuit Assessment of the Long-Term Reliability of E-Mode GaN HEMTs
1天前
待确认
Non‐destructive and deep learning‐enhanced characterization of 4H‐SiC material
3个月前
已完结
Dynamic high temperature operating life test methodology for long-term switching reliability of GaN power devices
3个月前
已完结
Product-level reliability of GaN devices
3个月前
已完结
Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device
7个月前
已完结
A Monolithically Integrated 2-Transistor Voltage Reference With a Wide Temperature Range Based on AlGaN/GaN Technology
1年前
已完结
Recent progress of physical failure analysis of GaN HEMTs
1年前
已完结
A Π-shaped p-GaN HEMT for reliable enhancement mode operation
2年前
已完结
Low-Resistance and Low-Thermal-Budget Ohmic Contact by Introducing Periodic Microstructures for AlGaN/AlN/GaN HEMTs
2年前
已完结
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