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NOIR4LU
Lv6
1620 积分
2023-06-26 加入
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X-Ray Diffraction Topography Methods (Review)
12天前
已完结
Formation mechanism of horizontal-half-loop arrays and stacking fault expansion behavior in thick SiC epitaxial layers
1个月前
已完结
Stacking faults in 4H–SiC epilayers and IGBTs
1个月前
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Analysis of Threading Edge Dislocation Low-Angle Grain Boundary Network Distributions in 4H-SiC Wafers Through Synchrotron X-ray Topography and Ray-Tracing Simulation
1个月前
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In-operando x-ray topography analysis of SiC metal–oxide–semiconductor field-effect transistors to visualize stacking fault expansion motions dynamically during operations
1个月前
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New Possibilities for the Analysis of Vibrating Crystal Deformations Using X-ray Rocking Curve Imaging
1个月前
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Analysis of Leakage Current in SiC Power MOSFET Static Avalanche Breakdown based on Temperature-Dependent Simulation
3个月前
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Study of Etching Processes for SiC Defect Analysis
3个月前
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Dislocations in 4H-SiC epilayers for power devices: Identification, formation, and regulation
4个月前
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Origins and characterization techniques of stress in SiC crystals: A review
4个月前
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Second nearest-neighbor modified embedded-atom method interatomic potentials for the Mo-M (M = Al, Co, Cr, Fe, Ni, Ti) binary alloy systems
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Partially coherent sources in interferometric sensors
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Atlas of Electrochemical Equilibria in Aqueous Solutions
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Semiconductor physics and devices basic principles
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Fisheries techniques(2nd ed)ISBN: 978-1-888569-00-1
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