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1610 积分 2024-05-27 加入
Understanding Hot Carrier Reliability in FinFET Technology from Trap-based Approach
14天前
已完结
Research on Reliability Optimization Mechanism of 28Hkmg Technology
22天前
已完结
Research on Hot Carrier Injection Optimization of 28HKMG Technology
22天前
已完结
E-beam Probing: A High-Resolution Technique to Read Volatile Logic and Memory Arrays on Advanced Technology Nodes
30天前
已完结
Physical Mechanism for Different Phases and Turn-Around of Idsat in PMOS under HCI Stress
1个月前
已完结
Analysis for the Physical Mechanism of the Abnormal Increase of Idsat in NMOS under HCI
1个月前
已完结
Effectiveness of Repairing Hot Carrier Degradation in Si p-FinFETs Using Gate Induced Drain Leakage
1个月前
已完结
Electron Beam Probing of Active Advanced FinFET Circuit with Fin Level Resolution
1个月前
已关闭
Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique
1个月前
已完结
A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
2个月前
已完结
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