Lv6
2120 积分 2022-03-16 加入
Effect of stress interruption on TDDB lifetime during constant voltage stressing in metal-ferroelectric-insulator-semiconductor ferroelectric devices
1个月前
已完结
Nondeterministic dynamics in the η-to-θ phase transition of alumina nanoparticles
1个月前
已完结
Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM
3个月前
已完结
Accelerated testing of SiO/sub 2/ reliability
3个月前
已关闭
Post breakdown reliability enhancement of ULSI circuits with novel gate dielectric stacks
3个月前
已关闭
10th Anniversary on the Discovery of Third Breakdown: Implications and Applications
3个月前
已关闭
(Keynote) Epitaxial Si/SiGe Multi-Stacks: From Stacked Nano-Sheet to Fork-Sheet and CFET Devices
5个月前
已完结
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions
5个月前
已完结
The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena
5个月前
已关闭
The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena
5个月前
已关闭
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