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950 积分 2021-02-20 加入
Impact of silicide process on eFuse programming, reliability and ruggedness in RF BiCMOS Technology
1小时前
待确认
Characterization of eFuse Programming for Varying RF BiCMOS Technology Silicides
1小时前
已完结
Impact of incorporated Al on the TiN/HfO2 interface effective work function
1天前
已完结
Technology Reliability Qualification of a 65nm CMOS Cu/Low-k BEOL Interconnect
3个月前
已完结
Reservoir effect and the role of low current density regions on electromigration lifetimes in copper interconnects
3个月前
已完结
Effect of post-pattern annealing on the grain structure and reliability of Al-based interconnects
3个月前
已完结
Power and sample size estimation in microarray studies
3个月前
已完结
Short line electromigration characteristics and their applications for circuit design
3个月前
已完结
TaN/Ta bilayer barrier characteristics and integration for 90 and 65nm nodes
4个月前
已完结
The contact resistance reduction of Cu interconnects by optimizing the crystal behavior of Ta/TaN diffusion barrier
4个月前
已完结
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