Lv11
60 积分 2023-09-10 加入
Theoretical Study on Structural and Electronic Properties of Interstitial Oxygen Defects in Amorphous Indium Gallium Oxide for Transistor Reliability
2小时前
求助中
Gate-induced drain leakage current characteristics of p-type polycrystalline silicon thin film transistors aged by off-state stress
2天前
已完结
Impact of Gaussian Grain Boundary Trap States on the Performance of the LTPS TFTs
2天前
已完结
Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors
21天前
已完结
Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED
2个月前
已完结
Effects of excess oxygen on operation characteristics of amorphous In-Ga-Zn-O thin-film transistors
6个月前
已完结
Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED
6个月前
已完结
Improving the electrical performance of vertical thin-film transistor by engineering its back-channel interface
6个月前
已完结
Mobility–stability trade-off in oxide thin-film transistors
8个月前
已完结
Illuminating Trap Density Trends in Amorphous Oxide Semiconductors with Ultrabroadband Photoconduction
8个月前
已完结
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