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190 积分 2024-09-04 加入
A Charge-Based Analytical Model for Gate All Around Junction-Less Field Effect Transistor Including Interface Traps
1个月前
已完结
Novel partial punch-through-stopper scheme for substrate leakage optimization of nanosheet field-effect transistors
1个月前
已完结
Analytical model for the drain and gate currents in silicon nanowire and nanosheet MOS transistors valid between 300 and 500 K
1个月前
已完结
Revisiting Lateral-BTBT Gate-Induced Drain Leakage in Nanowire FETs for 1T-DRAM
1个月前
已完结
Compact Model for Trap Assisted Tunneling based GIDL
2个月前
已完结
An Experimental Evaluation of Fin Width and Low-Temperature Influence on GIDL in Stacked SOI Nanowires
2个月前
已完结
Experimental assessment of gate-induced drain leakage in SOI stacked nanowire and nanosheet nMOSFETs at high temperatures
2个月前
已完结
Comprehensive evaluation of gate-induced drain leakage in SOI stacked nanowire nMOSFETs operating in high-temperatures
2个月前
已完结
Gate induced drain leakage in nanowire gate all around field effect transistors and methods to reduce GIDL
2个月前
已完结
Design for Variability: Counter-Doped Source/Drain Epitaxy Pockets in Gate-All-Around FET
2个月前
已完结
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